GIWAXS Characterization of Metal–Organic Framework Thin Films and Heterostructures: Quantifying Structure and Orientation

For optoelectronic applications of metal–organic framework (MOF) thin films, it is important to be able fabricate films and heterostructures that are highly oriented relative the substrate's surface normal. However, process optimization achieve this difficult without sufficiently detailed structural characterization deposited films. It demonstrated 2D grazing-incidence wide-angle X-ray scattering (GIWAXS) data from a laboratory system go long way providing such can 1) better test models than 1D scans, 2) provide quantitative estimate—useful for optimization—of fraction film has desired surface-oriented texture (2D powder), 3) deliver information as function depth into film—useful heterostructure characterization. Herein, GIWAXS collection analysis introduced in context understanding MOF then shown how powder fraction) UiO-66 fabricated by vapor-assisted conversion increased 4% over 95% minimizing nucleation solution. Finally, UiO-67 grown wherein both layers ordered (UiO-66 83%, >94%) once synthetic protocols optimized.